The evaluation of stress on bone level and tissue level short implants: A Finite Element Analysis (FEA) study.

PURPOSE: This study aimed to evaluate the difference between the stress level and distribution around the BL and TL short implants, and their surrounding structures, using finite element analysis. METHODS: Two different study models were constructed: BL model and TL model. Two dental implant systems (ITI (Straumann, Waldenburg, Switzerland) and NTA Short) with a diameter of 4.1 mm and 4 mm and with a length of 6 mm were used in this study. In each model, implants were placed in the mandibular 1st molar region. The von Mises stress and maximum principal (tensile) and minimum principal (compressive) stresses were evaluated. RESULTS: The highest stress values recorded in the BL implants (von Mises: 342.77 MPa), in the peri‑implant bone around the BL implants (maximum principal stress: 114.1 MPa), as a result of oblique loading, and overall stress values were found to be higher in the BL model. However, these measured values appeared to be low to cause a fracture, when considering the yield strengths of the materials and bone. CONCLUSIONS: The stress values were higher in the BL model, but not high enough to cause failure. Short implants could be an effective method of treatment for patients unsuitable for advanced surgical techniques.